Fred Kuper: search on Z-Library

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1

Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels –An explanation and die protection strategy

M.S.B. Sowariraj, Theo Smedes, Cora Salm, Ton Mouthaan, Fred G Kuper

Journal:

Microelectronics Reliability

Year:

2003

File:

PDF, 1.26 MB

2003

2

The effect of silicide on ESD performance of transistors

Guido Notermans, Anco Heringa, Maarten van Dort, Sander Jansen, Fred Kuper

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 697 KB

english, 2000

3

Using an SCR as ESD protection without latch-up danger

Guido Notermans, Fred Kuper, Jan-Marc Luchies

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 250 KB

english, 1997

4

Investigations on double-diffused MOS transistors under ESD zap conditions

Gianluca Boselli, Stan Meeuwsen, Ton Mouthaan, Fred Kuper

Journal:

Microelectronics Reliability

Year:

2001

Language:

english

File:

PDF, 778 KB

english, 2001

5

Rise-time effects in grounded gate nMOS transistors under transmission line pulse stress

Gianluca Boselli, Ton Mouthaan, Fred Kuper

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 225 KB

english, 2000

6

A 3-D Circuit Model to evaluate CDM performance of ICs

M.S.B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton Mouthaan, Fred G Kuper

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 695 KB

english, 2005

7

Impact of particles in ultra pure water on random yield loss in IC production

Faisal Wali, D. Martin Knotter, Auke Mud, Fred G. Kuper

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 609 KB

english, 2009

8

Automotive IC reliability: Elements of the battle towards zero defects

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 386 KB

english, 2008

9

Reservoir effect and maximum allowed VIA misalignment for AlCu interconnect with tungsten VIA plug

Yuan Li, Klaas Jelle Veenstra, Jerôme Dubois, Lei Peters-Wu, Agnes van Zomeren, Fred Kuper

Journal:

Microelectronics Reliability

Year:

2003

File:

PDF, 1.34 MB

2003

10

The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress

M.S.B. Sowariraj, Cora Salm, Ton Mouthaan, Fred G Kuper, Theo Smedes

Journal:

Microelectronics Reliability

Year:

2002

File:

PDF, 1.11 MB

2002

11

Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes

Guoqiao Tao, Andrea Scarpa, Leo van Marwijk, Kitty van Dijk, Fred Kuper

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 401 KB

english, 2004

12

RF CMOS reliability simulations

Sasse, Guido T., Acar, Mustafa, Kuper, Fred G., Schmitz, Jurriaan

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 232 KB

english, 2008

13

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Assessing the degradation mechanisms and current limitation design rules of SiCr-based thin-film resistors in integrated circuits

Li, Yuan, Donnet, David, Grzegorczyk, Andrzej, Cavelaars, Jan, Kuper, Fred

Year:

2010

Language:

english

File:

PDF, 392 KB

english, 2010

14

Relation between yield and reliability of integrated circuits and application to failure rate assessment and reduction in the one digit FIT and PPM reliability ERA

Jacob A. Van Der Pol, Fred G. Kuper, Eric R. Ooms

Journal:

Microelectronics Reliability

Year:

1996

Language:

english

File:

PDF, 628 KB

english, 1996

15

Significance of septal recruttment for defibrillation

Igor Singer, Claudio Maldonado, Fred Vance, Al Dawson, Takeshi Noda, Joel Kuper-Smith

Journal:

Journal of the American College of Cardiology

Year:

1990

File:

PDF, 335 KB

1990

16

[IEEE 2011 Materials for Advanced Metallization (MAM) - Dresden, Germany (2011.05.8-2011.05.12)] 2011 IEEE International Interconnect Technology Conference - Process transfers provide opportunities for more reliable products

Kuper, Fred, Wessels, Piet, Ooms, Eric, van Herk, Joost, Rijnsburger, Marcel, van Driel, Willem, Plagge, Jos

Year:

2011

Language:

english

File:

PDF, 271 KB

english, 2011

17

Analysis of HBM ESD testers and specifications using a fourth-order lumped element model

Koen Verhaege, Philippe J. Roussel, Guido Groeseneken, Herman E. Maes, Horst Gieser, Christian Russ, Peter Egger, Xaver Guggenmos, Fred G. Kuper

Journal:

Quality and Reliability Engineering International

Year:

1994

Language:

english

File:

PDF, 876 KB

english, 1994

18

A holistic approach to the safety assessment of exploratory drug targets

Venhorst, Jennifer, Rankouhi, Tanja Rouhani, Verschuren, Lars, van Someren, Eugene P., Kuper, Frieke C., Wolterbeek, Andre P.M., van de Brug, Fred J., Folkertsma, Simon, Krul, Cyrille A.M.

Journal:

Journal of Pharmacological and Toxicological Methods

Year:

2016

Language:

english

File:

PDF, 68 KB

english, 2016

19

The Los Angeles County–Hollywood Museum

Theodore Fred Kuper

Journal:

Journal of the University Film Producers Association

Year:

1964

Language:

english

File:

PDF, 528 KB

english, 1964

20

On the use of DC measurements for ESD-related process monitoring

Jan Marc Luchies, Fred Kuper, Jan Verweij

Journal:

Quality and Reliability Engineering International

Year:

1993

Language:

english

File:

PDF, 386 KB

english, 1993

21

Suppression and origin of soft ESD failures in a submicron CMOS process

Fred Kuper, Jan Marc Luchies, Joop Bruines

Journal:

Journal of Electrostatics

Year:

1994

Language:

english

File:

PDF, 477 KB

english, 1994

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